XTOP 2016
Atomicus participated in the 13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging (XTOP), which took place in Brno, Czech Republic from September 4 to 8.
XTOP brought together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, X-ray absorption, and phase contrast imaging. It is one of the most important scientific conferences concerning methods and instrumentation in laboratory and synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.
- High-resolution diffraction and topography
- X-ray reflectometry and small-angle scattering
- Microdiffraction and nanodiffraction
- Coherent diffraction imaging
- Absorption and phase contrast imaging and tomography
- Resonant (anomalous) scattering
- Fluorescence imaging
- Time-resolved methods
- Theory and simulations of X-ray scattering
- Material science (from 0D to 3D objects)
- Nanomaterials and nanoscience
- Life and environmental sciences
- Nondestructive testing (including industrial needs and cultural heritage)
- X-ray optics and instrumentation
- Advances in laboratory instrumentation and applications
- Advances in synchrotron instrumentation and applications
- Experiments with X-ray free-electron lasers
