XTOP 2016


Atomicus participated in the 13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging (XTOP), which took place in Brno, Czech Republic from September 4 to 8.
XTOP brought together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, X-ray absorption, and phase contrast imaging. It is one of the most important scientific conferences concerning methods and instrumentation in laboratory and synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.

The following issues were covered at the conference:
  • High-resolution diffraction and topography
  • X-ray reflectometry and small-angle scattering
  • Microdiffraction and nanodiffraction
  • Coherent diffraction imaging
  • Absorption and phase contrast imaging and tomography
  • Resonant (anomalous) scattering
  • Fluorescence imaging
  • Time-resolved methods
  • Theory and simulations of X-ray scattering
  • Material science (from 0D to 3D objects)
  • Nanomaterials and nanoscience
  • Life and environmental sciences
  • Nondestructive testing (including industrial needs and cultural heritage)
  • X-ray optics and instrumentation
  • Advances in laboratory instrumentation and applications
  • Advances in synchrotron instrumentation and applications
  • Experiments with X-ray free-electron lasers

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